X- ray diffractometer is an instrument used for indentification of crystal forming sample employing electromagnetic wave of x-ray radiation. The result obtained from the experiment is relative intensity (I/I1) and scattering angle ( 2 รจ ). The scattered x-ray is from atoms of crystal lattice of observed sample. For the preparation of materials identification programme based on x-ray diffraction data, a development of software covering the steps of regression, differentiation and integral has been done. Diffraction peaks from sample with highest relative intensity are used to determine plane spacing value (dhkl) and each plane spacing value will be compared with database to identify the analysed material.
Key words : sample identification, software, qualitatif analysis, x-ray diffraction, Hanawalt method.
P3TkN – BATAN Bandung
Key words : sample identification, software, qualitatif analysis, x-ray diffraction, Hanawalt method.
P3TkN – BATAN Bandung
