The Electronic Structure ofWurtzite MnS


Manganese sulfide thin films have been investigated by X-ray Absorption Fine Structure spectroscopy
(XAFS). XAFS provides a description of the structure of the films. The paper also presents a structural characterisation
of the wurtzite MnS thin films and their crystallisation behaviour by annealing at increasing temperatures. The x-ray
absorption fine structure (XAFS) ofMn K-edge and S K-edge in wurtzite MnS have been investigated. The full multiple
scattering approach has been applied to the calculation of Mn Kedge XANES spectra of MnS. The calculations are
based on different choices of one electron potentials according to Mn coordinations by using the real space multiple
scattering method FEFF 8.0 code. The crystallographic and electronic structure of the MnS are tested at various
temperature ranges from 300 to 573 K. We have found prominent changes in theXANES spectra of Mangeanese sulfide
thin films by the change of the temperature. Such observed changes are explained by considering the structural,
electronic and spectroscopic properties. The results are consistent with experimental spectra.
Keywords: MnS Thin Film, Electronic Properties, Chalcogenide, XANESO. Murat Ozkendir, A. Turker Tuzemen, Y. Ufuktepe
Physics Department, University ofCukurova, OJ330 Adana, Turkey